Search results for: springer-handbook-of-microscopy

Springer Handbook of Microscopy

Author : Peter W. Hawkes
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This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Handbook of Microscopy for Nanotechnology

Author : Nan Yao
File Size : 55.25 MB
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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Springer Handbook of Nanotechnology

Author : Bharat Bhushan
File Size : 69.63 MB
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This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments. It integrates nanofabrication, nanomaterials, nanodevices, nanomechanics, nanotribology, materials science, and reliability engineering knowledge in just one volume. Furthermore, it discusses various nanostructures; micro/nanofabrication; micro/nanodevices and biomicro/nanodevices, as well as scanning probe microscopy; nanotribology and nanomechanics; molecularly thick films; industrial applications and nanodevice reliability; societal, environmental, health and safety issues; and nanotechnology education. In this new edition, written by an international team of over 140 distinguished experts and put together by an experienced editor with a comprehensive understanding of the field, almost all the chapters are either new or substantially revised and expanded, with new topics of interest added. It is an essential resource for anyone working in the rapidly evolving field of key technology, including mechanical and electrical engineers, materials scientists, physicists, and chemists.

Handbook of Biological Confocal Microscopy

Author : James Pawley
File Size : 74.97 MB
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Once the second edition was safely off to the printer, the 110 larger world of micro-CT and micro-MRI and the smaller world authors breathed a sigh of relief and relaxed, secure in the belief revealed by the scanning and transmission electron microscopes. that they would “never have to do that again. ” That lasted for 10 To round out the story we even have a chapter on what PowerPoint years. When we ?nally awoke, it seemed that a lot had happened. does to the results, and the annotated bibliography has been In particular, people were trying to use the Handbook as a text- updated and extended. book even though it lacked the practical chapters needed. There As with the previous editions, the editor enjoyed a tremendous had been tremendous progress in lasers and ?ber-optics and in our amount of good will and cooperation from the 124 authors understanding of the mechanisms underlying photobleaching and involved. Both I, and the light microscopy community in general, phototoxicity. It was time for a new book. I contacted “the usual owe them all a great debt of gratitude. On a more personal note, I suspects” and almost all agreed as long as the deadline was still a would like to thank Kathy Lyons and her associates at Springer for year away.

Handbuch der Umformtechnik

Author : Schuler GmbH
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Prozessor 386 (486 od. Pentium Pro empf.), 8 MB (16 empf.), RAM, 6 MB freier Festplattenspeicher, Bildschirmauflösusung 640 x 480, 256 Farben

Springer Handbook of Surface Science

Author : Mario Rocca
File Size : 79.52 MB
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Springer Handbook of Lasers and Optics

Author : Frank Träger
File Size : 88.40 MB
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This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.

Sample Preparation Handbook for Transmission Electron Microscopy

Author : Jeanne Ayache
File Size : 62.68 MB
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Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Springer Handbook of Mechanical Engineering

Author : Karl-Heinrich Grote
File Size : 28.28 MB
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This resource covers all areas of interest for the practicing engineer as well as for the student at various levels and educational institutions. It features the work of authors from all over the world who have contributed their expertise and support the globally working engineer in finding a solution for today‘s mechanical engineering problems. Each subject is discussed in detail and supported by numerous figures and tables.

Springer Handbook of Electronic and Photonic Materials

Author : Safa Kasap
File Size : 28.96 MB
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The second, updated edition of this essential reference book provides a wealth of detail on a wide range of electronic and photonic materials, starting from fundamentals and building up to advanced topics and applications. Its extensive coverage, with clear illustrations and applications, carefully selected chapter sequencing and logical flow, makes it very different from other electronic materials handbooks. It has been written by professionals in the field and instructors who teach the subject at a university or in corporate laboratories. The Springer Handbook of Electronic and Photonic Materials, second edition, includes practical applications used as examples, details of experimental techniques, useful tables that summarize equations, and, most importantly, properties of various materials, as well as an extensive glossary. Along with significant updates to the content and the references, the second edition includes a number of new chapters such as those covering novel materials and selected applications. This handbook is a valuable resource for graduate students, researchers and practicing professionals working in the area of electronic, optoelectronic and photonic materials.

Science of Microscopy

Author : Peter Hawkes
File Size : 62.50 MB
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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Handbook of Biological Confocal Microscopy

Author : James Pawley
File Size : 55.26 MB
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This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition and properties of fluorescent dyes, the techniques of 3D specimen preparation and the fundamental limitations, and practical complexities of quantitative confocal fluorescence imaging. Coverage includes practical multiphoton, photodamage and phototoxicity, 3D FRET, 3D microscopy correlated with micro-MNR, CARS, second and third harmonic signals, ion imaging in 3D, scanning RAMAN, plant specimens, practical 3D microscopy and correlated optical tomography.

Scanning Transmission Electron Microscopy

Author : Stephen J. Pennycook
File Size : 22.63 MB
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Springer Handbook of Nanomaterials

Author : Robert Vajtai
File Size : 62.41 MB
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The Springer Handbook of Nanomaterials covers the description of materials which have dimension on the "nanoscale". The description of the nanomaterials in this Handbook follows the thorough but concise explanation of the synergy of structure, properties, processing and applications of the given material. The Handbook mainly describes materials in their solid phase; exceptions might be e.g. small sized liquid aerosols or gas bubbles in liquids. The materials are organized by their dimensionality. Zero dimensional structures collect clusters, nanoparticles and quantum dots, one dimensional are nanowires and nanotubes, while two dimensional are represented by thin films and surfaces. The chapters in these larger topics are written on a specific materials and dimensionality combination, e.g. ceramic nanowires. Chapters are authored by well-established and well-known scientists of the particular field. They have measurable part of publications and an important role in establishing new knowledge of the particular field.

Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis

Author : Patrick Echlin
File Size : 46.31 MB
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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Handbook of Crystallography

Author : Allen G. Jackson
File Size : 84.12 MB
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This book resulted from a series of frustrations. Analytical electron microscopy requires exactly what its name implies: quantitative information to conduct an analysis. The frustrations arose when I started hunting for specific forms of equations in a form understandable to a non-crystaHographer, for definitions of subtle concepts related to crystallography, for intelligible interpretations of space group symbols and their significance. What I frequently discovered was that such information was buried in a giant tome and couched in terms familiar to crystallographers but not to electron microscopists in general, or it was located in an old reference not available in my library, or it was found in an out-of-print book, or it was in a Russian book no longer available, etc. So to minimize the frustrations, I started a notebook containing the details, particularly after I had found forms of equations useful for quick calculations or equations in a form useful for proving, doing, or extending calculations found in a reference. The resulting notebook grew to a respectable size, requiring some organizing of the contents. Finally, the size became large enough, and has proven useful enough, to produce the notebook as a book.

Handbook of microscopic anatomy

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Springer Handbook of Experimental Solid Mechanics

Author : William N. Sharpe
File Size : 27.60 MB
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As a reference book, the Springer Handbook provides a comprehensive exposition of the techniques and tools of experimental mechanics. An informative introduction to each topic is provided, which advises the reader on suitable techniques for practical applications. New topics include biological materials, MEMS and NEMS, nanoindentation, digital photomechanics, photoacoustic characterization, and atomic force microscopy in experimental solid mechanics. Written and compiled by internationally renowned experts in the field, this book is a timely, updated reference for both practitioners and researchers in science and engineering.

Sample Preparation Handbook for Transmission Electron Microscopy

Author : Jeanne Ayache
File Size : 21.70 MB
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Download : 447
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Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Handbook of Microscopy for Nanotechnology

Author : Nan Yao
File Size : 76.39 MB
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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.